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The increasing complexity and cost of manufacturing monolithic chips have driven the semiconductor industry toward chiplet-based designs, where smaller, modular chiplets are integrated onto a single interposer. While chiplet architectures offer significant advantages, such as improved yields, design flexibility, and cost efficiency, they introduce new security challenges in the horizontal hardware manufacturing supply chain. These challenges include risks of hardware Trojans, cross-die side-channel and fault injection attacks, probing of chiplet interfaces, and intellectual property theft. To address these concerns, this paper presents ChipletQuake, a novel on-chiplet framework for verifying the physical security and integrity of adjacent chiplets during the post-silicon stage. By sensing the impedance of the power delivery network (PDN) of the system, ChipletQuake detects tamper events in the interposer and neighboring chiplets without requiring any direct signal interface or additional hardware components. Fully compatible with the digital resources of FPGA-based chiplets, this framework demonstrates the ability to identify the insertion of passive and subtle malicious circuits, providing an effective solution to enhance the security of chiplet-based systems. To validate our claims, we showcase how our framework detects hardware Trojans and interposer tampering. 

Stealthy chip-level tamper attacks, such as hardware Trojan insertions or security-critical circuit modifications, can threaten modern microelectronic systems’ security. While traditional inspection and side-channel methods offer potential for tamper detection, they may not reliably detect all forms of attacks and often face practical limitations in terms of scalability, accuracy, or applicability. This work introduces a non-invasive, contactless tamper detection method employing a complementary split-ring resonator (CSRR). CSRRs, which are typically deployed for non-destructive material characterization, can be placed on the surface of the chip’s package to detect subtle variations in the impedance of the chip’s power delivery network (PDN) caused by tampering. The changes in the PDN’s impedance profile perturb the local electric near field and consequently affect the sensor’s impedance. These changes manifest as measurable variations in the sensor’s scattering parameters. By monitoring these variations, our approach enables robust and cost-effective physical integrity verification requiring neither physical contact with the chips or printed circuit board (PCB) nor activation of the underlying malicious circuits. To validate our claims, we demonstrate the detection of various chip-level tamper events on an FPGA manufactured with 28 nm technology.